The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Feb. 05, 2004
Liang-chia Chen, Jhonghe, TW;
Tshih Tsung, Taipei, TW;
Jen-yan Sun, Jhudong Township, Hsinchu County, TW;
Hong-ming Lin, Taipei, TW;
Liang-Chia Chen, Jhonghe, TW;
Tshih Tsung, Taipei, TW;
Jen-Yan Sun, Jhudong Township, Hsinchu County, TW;
Hong-Ming Lin, Taipei, TW;
National Taipei University of Technology, Taipei, TW;
Abstract
The invention provides an on-line sampling apparatus for the metal nanoparticle fluid of the vacuum submerged arc process and the method thereof, using the principle of the pressure difference between the vacuum pump and the vacuum chamber and the constant temperature design of the sample pipeline to make the sample precisely be caught and flow into the predetermined collector, and the disadvantage of the vaporization of the sample due to the temperature rise caused by the ambient temperature can be prevented. Further, the invention integrates with a particle size analysis apparatus to carry out real time measurement and data analysis of the nanoparticle fluid with real time process characteristics, wherein the nanoparticle fluid is caught from the nanofluid process line, thus, the optimal design work of the process and the system parameters and particle quality monitoring may be proceeded efficiently.