The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2009
Filed:
Mar. 10, 2004
Fumiaki Tajima, Kanagawa, JP;
Naoki Miyatake, Kanagawa, JP;
Hideaki Sato, Tokyo, JP;
Nobuo Matsuda, Yamaguchi, JP;
Fumiaki Tajima, Kanagawa, JP;
Naoki Miyatake, Kanagawa, JP;
Hideaki Sato, Tokyo, JP;
Nobuo Matsuda, Yamaguchi, JP;
Yokohama TLO Company Ltd., Kanagawa, JP;
Abstract
An ocular fundus portion analyzer and the method are provided for attaining accurate and quick detection and diagnoses of an ocular fundus defect portion, such as an excavation of an optic disk caused by glaucoma and a macula retinae caused by retinal detachment, by dealing with a large number of single-shot ocular fundus images, for example, taken in physical examinations. It is configured to include an image importing portion for importing an image of an ocular fundus portion taken by a visible radiation or a near-infrared radiation; a pixel data generation portion for generating pixel data including pixel positions and luminance of pixels constituting the image; a local plane gradient image generation portion for generating a three-dimensional image from pixel positions and luminance of the pixel data, obtaining a local approximation plane at any pixel and generating a local plane gradient image from a gradient angle with respect to a control plane of the three-dimensional image; and a display portion for displaying the local plane gradient image.