The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

Oct. 11, 2007
Applicants:

Thomas E. Plowman, Raleigh, NC (US);

Warren R. Jewett, Cary, NC (US);

Inventors:

Thomas E. Plowman, Raleigh, NC (US);

Warren R. Jewett, Cary, NC (US);

Assignee:

Memsys, Inc., Cary, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01F 1/68 (2006.01); G01P 5/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention is a solid state microanemometer and a method of making thereof. Specifically, the invention relates to a microanemometer including an electrically conductive resistor in the form of a semiconductor wafer doped with an impurity having an upper surface, a lower surface having a peripheral edge; a substrate bonded to the semiconductor wafer having an upper surface, a cavity having a peripheral edge and a peripheral margin defined on the upper surface and bounded by the peripheral edge of the cavity wherein the lower surface of the semiconductor wafer rests on and is supported by at least part of the peripheral edge of the cavity such that the semiconductor wafer is over the cavity; and a means for electrically connecting the resistor to a current source. The microanemometer also includes a plurality of metal conductors in contact with the resistor. The semiconductor wafer has sloped sidewalls and the metal conductors are placed on sloped sidewalls of the wafer to effectively increase available active area of the resistor.


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