The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7500383 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 10, 2009

Filed:

Oct. 27, 2005
Applicant:

Kenneth John Davey, Osborne Park, AU;

Inventor:

Kenneth John Davey, Osborne Park, AU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for monitoring the integrity of a permeable structure that is disposed in an environment containing a fluid at ambient pressure is provided. At least one cavity is formed in or on the permeable structure. A source of first fluid is provided at a first pressure greater than the ambient pressure. The cavity is coupled to the source through a high-fluid-flow impedance to establish a flow of the first fluid through the permeable structure via the cavity. A rate of flow of the first fluid through the permeable structure is allowed to stabilize to a steady-state rate. A change in the steady-state flow rate of the first fluid through the permeable structure is monitored.


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Davey, Kenneth. (2009). Method and apparatus for monitoring the integrity of components and structures (U.S. Patent No. 7500383). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7500383

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