The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 10, 2009

Filed:

Jul. 30, 2007
Applicants:

Andreas Schroter, Traunstein, DE;

Thomas Jäger, Trostberg, DE;

Waltraud Aichhorn, Palling, DE;

Inventors:

Andreas Schroter, Traunstein, DE;

Thomas Jäger, Trostberg, DE;

Waltraud Aichhorn, Palling, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for assembling a position measuring arrangement for measuring a relative position of a first object with respect to a second object, wherein the position measuring arrangement includes a first unit movable in relation to a second unit of the position measuring arrangement, the method including fastening said first unit to the first object and fastening the second unit to the second object. The method further including adjusting a required scanning distance (A) between a scanning element of the second unit and a graduation of the second unit by applying a gauge to a first limit stop face of the first unit, as well as to a second limit stop face of the second unit. Prior to the fastening the first unit and the fastening the second unit, positioning and fixing either the first limit stop face on the first unit or the second limit stop face on the second unit in a direction of the required scanning distance so that the scanning distance (A) is optimally adjusted.


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