Systems and methods for controlling clock signals during scan testing integrated circuits

Abstract

The present invention is directed to systems and method of controlling clock signals during scan testing integrated circuits. The methods and systems provide efficient at-speed scan testing while minimizing the external pins on an integrated circuit dedicated to scan testing clock sources. A clock control circuit is disclosed that includes a scan test control module for permitting a clock signal to be transmitted and a scan test clock decision module for determining whether a clock signal should be permitted to be transmitted. An integrated circuit is disclosed that includes a set of clock control circuits. Embodiments of a scan test control module are provided that can process decoder inputs, ATPG inputs or both. A method is provided that can be used, for example, by an ATPG tool to efficiently provided at-speed scan testing while minimizing external pins dedicated to scan testing clock sources.