The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Jun. 01, 2004
Joel P Dunsmore, Sebastopol, CA (US);
Loren C Betts, Rohnert Park, CA (US);
Joel P Dunsmore, Sebastopol, CA (US);
Loren C Betts, Rohnert Park, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A test system and methods using the test system correlate measurements of a device under test (DUT) regardless of which test fixture is used for in-fixture testing of the DUT. The test system includes test equipment, a test fixture that interfaces the DUT to the test equipment, a computer and a computer program executed by the computer. The computer program includes instructions that implement determining a port-specific difference array for test fixtures used with the test system. The difference array describes a difference between the test fixtures at a corresponding test port thereof. The method includes determining the difference array, measuring a performance of the DUT in a second test fixture, and applying the difference array such that the measured performance approximates a hypothetical DUT performance for the DUT as if mounted in a first test fixture.