The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7500143 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 03, 2009

Filed:

May. 07, 2001
Applicants:

Christopher A. Buia, Dover, NH (US);

Thomas S. Pantelis, Portsmouth, NH (US);

David K. Taylor, Durham, NH (US);

Scott Ball, Newmarket, NH (US);

Nathaniel J. Rockwell, Chester, NH (US);

Inventors:

Christopher A. Buia, Dover, NH (US);

Thomas S. Pantelis, Portsmouth, NH (US);

David K. Taylor, Durham, NH (US);

Scott Ball, Newmarket, NH (US);

Nathaniel J. Rockwell, Chester, NH (US);

Assignee:

Computer Associates Think, Inc., Islandia, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system () for analyzing a fault includes a fault object factory () constructed and arranged to receive fault data and create a fault object (), and a fault diagnosis engine () constructed and arranged to perform root cause analysis of the fault object. The system may further include a fault detector () constructed and arranged to detect the fault data in a monitored entity, a fault repository () constructed and arranged to store and access the fault object; and a fault handler () constructed and arranged to be triggered by the fault diagnosis engine to analyze the fault object.


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