The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2009

Filed:

Jun. 29, 2006
Applicants:

Leo Montreuil, Atlanta, GA (US);

Wayne B. Williams, Grayson, GA (US);

Samuel H. Russ, Lawrenceville, GA (US);

Robert A. Kriete, Lawrenceville, GA (US);

Inventors:

Leo Montreuil, Atlanta, GA (US);

Wayne B. Williams, Grayson, GA (US);

Samuel H. Russ, Lawrenceville, GA (US);

Robert A. Kriete, Lawrenceville, GA (US);

Assignee:

Cisco Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the input port being coupled to at least one tuning device. Other embodiments include tuning, via the at least one tuning device, the STT according to the test pattern and converting the decoded test pattern to at least one output signal.


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