The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Aug. 25, 2005
Makoto Yamamoto, Komatsu, JP;
Akihiro Yoshimoto, Komatsu, JP;
Makoto Yamamoto, Komatsu, JP;
Akihiro Yoshimoto, Komatsu, JP;
Komatsu Machinery Corporation, Ishikawa, JP;
Abstract
A device for inspecting for minute flaws upon the outer surface of journal or pin portions of a crank shaft comprises a main deviceand a control deviceThe main devicebrings a gauge head, which can freely move forwards and backwards along a Y axis direction, into contact with an inspection regionA of the the crank shaftwhile rotating the crank shaftaround a rotational axisC, measures the surface position of the inspection regionA for each of rotational angles, and obtains surface portion waveform data corresponding to rotational angle. The gauge headhas an oscillation function, and always contacts against the inspection regionA during rotation. The control deviceextracts high frequency waveform components from the obtained waveform data, and detects flaws on the inspection region based on the high frequency waveform components.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile