The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Aug. 30, 2005
Makoto Nagura, Kyoto, JP;
Yuki Ishii, Kyoto, JP;
Hideyuki Ikeda, Kyoto, JP;
Takuji Kurozumi, Kyoto, JP;
Yoshiaki Togawa, Kyoto, JP;
Makoto Nagura, Kyoto, JP;
Yuki Ishii, Kyoto, JP;
Hideyuki Ikeda, Kyoto, JP;
Takuji Kurozumi, Kyoto, JP;
Yoshiaki Togawa, Kyoto, JP;
Horiba, Ltd., Kyoto, JP;
Abstract
In a measurement system, by suppressing the environmental changes of counter-flow of air, and temperature changes and the like, measurement can be accomplished with stable high precision and replication, and by providing a transparent cellwhich stores a particles dispersed in a dispersion medium, and a light source which irradiates light onto the particles within the transparent cell, and multiple light detectorsscattered and arranged to detect the intensity of diffracted/scattered light produced by the irradiation of light, and a computer devicewhich calculates the particle size distribution of the particles based on the light intensity signal output from the light detectors, in addition to the establishment of cell storage space S which stores the transparent celland the equipment storage spaces Sand Swhich store the light source, the light detector, and the optical device, the equipment storage spaces Sand Sare given tight closed construction separate from the cell storage space S.