The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
May. 03, 2004
John R. Squilla, Rochester, NY (US);
John T. Boland, Fairport, NY (US);
John P. Spoonhower, Webster, NY (US);
John R. Squilla, Rochester, NY (US);
John T. Boland, Fairport, NY (US);
John P. Spoonhower, Webster, NY (US);
Carestream Health, Inc., Rochester, NY (US);
Abstract
A method of comparing the size of a feature in sequential X-ray images includes the steps of: forming first and second sequential X-ray images including an image of the feature, an image of a first target located directly adjacent the feature and an image of a second target located between the object and an X-ray detector; calculating scale factors for the first and second X-ray images based on the relative sizes of the images of the first and second targets in the X-ray images; measuring the sizes of the feature in the first and second X-ray images; adjusting the measured sizes of the feature in the first and second X-ray images by the respective scale factors; and comparing the adjusted measured sizes. A computer program product for performing the method is also provided.