The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Jul. 12, 2004
Takanari Tanabata, Saitama, JP;
Tomoko Shinomura, Higashimatsuyama, JP;
Toru Ishizuka, Higashikurume, JP;
Masafumi Kanetomo, Tokyo, JP;
Takanari Tanabata, Saitama, JP;
Tomoko Shinomura, Higashimatsuyama, JP;
Toru Ishizuka, Higashikurume, JP;
Masafumi Kanetomo, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
There are provided an image acquisition system capable of storing high-accuracy measurement of changes in the shape of a plant growing process in image information with high accuracy and an analyzing method for analyzing an acquired image to analyze plant growing. There is provided a plant growing analyzing system having operation detection means of a conveying mechanism of a plant in order that an observed plant in an image is photographed at a constantly fixed position or angle; a position detecting mark in the acquired image; a computation part for evaluating detected data to control a conveying amount; and a conveying control part, wherein the growing process of many plants is stored in image information in a long period, and the stored image is used to realize high-accuracy measurement.