The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
May. 20, 2004
Donna G. Albertson, Lafayette, CA (US);
Daniel Pinkel, Lafayette, CA (US);
Donna G. Albertson, Lafayette, CA (US);
Daniel Pinkel, Lafayette, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
This invention provides an imaging system for high-accuracy quantitative analysis of a microarray. In certain embodiments, the system comprises a broad band excitation light source that provides Kohler illumination of said microarray at an incident angle that ranges from about 30 degrees to about 75 degrees from the normal to the microarray, and that has less than about ±25 percent variation in intensity over the array at all wavelengths ranging from 400 to 800 nm; a support for holding a microarray; a detection lens system that is chromatically corrected so the apparent position of the microarray or a feature comprising the microarray varies by less than 10 μm as the detection wavelength varies from about 400 to about 800 nm; and a detection device for detecting and optionally recording an image produced by said detection lens system.