The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2009

Filed:

Sep. 29, 2004
Applicants:

Hisashi Abe, Osaka, JP;

Derek Luke, Brampton, CA;

Inventors:

Hisashi Abe, Osaka, JP;

Derek Luke, Brampton, CA;

Assignees:

Ifire IP Corporation, Toronto, Ontario, CA;

Sanyo Electric Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 9/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for improving testability of electroluminescent displays (ELDs) comprises at least two sets of electrodes, one set for connecting rows of pixels, and a second set for connecting columns of pixels, wherein at least one electrode set is interleaved in two subsets. The first subset has electrode extensions of a first length, and the second subset has electrode extensions of a second, shorter, length. A first connector is disposed generally in a direction perpendicular to the electrode extensions of both subsets and in electrical contact with the electrode extensions of the second subset. A second connector is disposed generally in a direction perpendicular to the electrode extensions of the first subset, and in electrical contact with the electrode extensions of only the first subset. A set of insulating patches separate the electrode extensions of the first subset from the first connector.


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