The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Mar. 28, 2006
Thomas William Birdwell, Middletown, OH (US);
Andrew Joseph Galish, West Chester, OH (US);
Thomas William Birdwell, Middletown, OH (US);
Andrew Joseph Galish, West Chester, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A radiographic inspection system includes an electron gun, a fixed anode of a dense material, and apparatus for steering an electron beam generated by the electron gun to multiple focal spots on the anode. A detector includes a plurality of individual detector elements. Operation of the system includes is carried out by directing the electron beam at a first time interval to a first focal spot on the anode, generating a first X-ray beam aligned with a first detector element. During a second time interval, the electron beam is directed to a second focal spot on the anode, spaced-away from the first focal spot, generating a second X-ray beam aligned with a second detector element. This cycle is repeated with additional focal spots in a one-dimensional or two-dimensional pattern. The detector element output is read in coordination with the position of the electron beam.