The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2009

Filed:

Feb. 27, 2004
Applicants:

Yuqun Chen, Bellevue, WA (US);

Darko Kirovski, Bellevue, WA (US);

Yacov Yacobi, Mercer Island, WA (US);

Gideon A. Yuval, Mercer Island, WA (US);

Inventors:

Yuqun Chen, Bellevue, WA (US);

Darko Kirovski, Bellevue, WA (US);

Yacov Yacobi, Mercer Island, WA (US);

Gideon A. Yuval, Mercer Island, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are disclosed to enable utilization of randomly-occurring features of a label (whether embedded or naturally inherent) to provide counterfeit-resistant and/or tamper-resistant labels. More specifically, labels including randomly-occurring features are scanned to determine the labels' features. The information from the scan is utilized to provide identifying indicia which uniquely identifies each label and may be later verified against the label features that are present to determine whether the label is genuine. In a described implementation, the identifying indicia may be cryptographically signed.


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