The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Feb. 20, 2004
Applicants:
Po-wei Liu, Tai-Nan, TW;
Chang-lien Wu, Tai-Chung, TW;
Inventors:
Po-Wei Liu, Tai-Nan, TW;
Chang-Lien Wu, Tai-Chung, TW;
Assignee:
Realtek Semiconductor Corp., Science Park, HsinChu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing the integrity of a memory with defective sections under a plurality of operating environments includes testing the memory with defective sections under a plurality of operating environments, recording results of each operating environment test, and comparing the results of the tests. If the results of are the same, the memory with defective sections is declared to have integrity. If not, the memory with defective sections is declared to not have integrity.