The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Nov. 16, 2005
Adam S. Browen, Colorado Springs, CO (US);
Craig Chafin, Colorado Springs, CO (US);
Jeffery K. Whitt, Colorado Springs, CO (US);
Steve A. Olson, Fort Collins, CO (US);
Adam S. Browen, Colorado Springs, CO (US);
Craig Chafin, Colorado Springs, CO (US);
Jeffery K. Whitt, Colorado Springs, CO (US);
Steve A. Olson, Fort Collins, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
An apparatus and a method for analyzing signals within an integrated circuit are described. In one embodiment of the present invention, internal IC signals are tapped, sampled and stored according to one or more sampling criteria. The signals may be taken from multiple locations within the IC and the information stored may include data, timing information, control data and other such information related to the tapped signals. The stored information may be provided to an external device for analysis.