The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2009

Filed:

Oct. 05, 2007
Applicants:

Thomas E. Anderson, Hyde Park, NY (US);

Patrick M. Flaherty, Pleasant Valley, NY (US);

Jeffrey P. Gifford, Fishkill, NY (US);

Nathaniel C. Lange, Newburgh, NY (US);

Ray A. Reyes, New Windsor, NY (US);

Inventors:

Thomas E. Anderson, Hyde Park, NY (US);

Patrick M. Flaherty, Pleasant Valley, NY (US);

Jeffrey P. Gifford, Fishkill, NY (US);

Nathaniel C. Lange, Newburgh, NY (US);

Ray A. Reyes, New Windsor, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A computing system for monitoring activity in an automated fabrication facility includes a computer operably coupled to an MES (Manufacturing Execution Systems) database having data relating to manufacturing operation events; and the computer also being operably coupled to an AMHS (Automated Material Handling Systems) database having data relating to movement of the work-in-process material lots between the manufacturing operations and the storage operations; and a solver product operatively installed on the computer for processing information regarding timing of the events and information regarding operation of the automated material handling system to generate a report regarding performance of the automated fabrication facility, wherein the report identifies information regarding a sequence of events having occurred in the manufacturing process.


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