The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Oct. 14, 2005
Tak Kui Wang, Saratoga, CA (US);
Christopher L. Coleman, Santa Clara, CA (US);
Tak Kui Wang, Saratoga, CA (US);
Christopher L. Coleman, Santa Clara, CA (US);
Avago Technologies Fiber IP (Singapore) Pte. Ltd., Singapore, SG;
Abstract
Compactness is preserved while enabling beam monitoring of optical properties of an output beam by employing a combination of reflection and diffraction. An input beam is reflected, divided using reflection/diffraction, and re-reflected. As a consequence, both a light source and one or more beam monitoring detectors may be disposed along a single side of an optical module. In one embodiment, an input beam is introduced from a first side of an optical module, is reflected by a 45 degree mirror, and is divided by a diffraction grating which redirects a minor portion of the beam energy back to the 45 degree mirror. Following the second reflection from the mirror, the returned portion of the beam is used to measure one or more optical properties.