The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Mar. 11, 2005
Nobufumi Mori, Kanagawa-ken, JP;
Katsumi Hayashi, Kanagawa-ken, JP;
Nobufumi Mori, Kanagawa-ken, JP;
Katsumi Hayashi, Kanagawa-ken, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An analysis chip comprises a thin film layer, which is formed on a dielectric material block and has two different regions. A flow path unit comprising a supply path for supplying a sample onto the thin film layer and a discharging path for discharging the sample is releasably loaded into the analysis chip. A light beam is irradiated to a first interface between one region of the thin film layer and the dielectric material block, and a second interface between the other region of the thin film layer and the dielectric material block, in a parallel manner. Refractive index information with regard to a substance to be analyzed, which is located on the thin film layer, is acquired from intensities of the light beam totally reflected from the first interface and the light beam totally reflected from the second interface.