The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Sep. 06, 2006
Applicant:
Steven R. Walton, Buckley, WA (US);
Inventor:
Steven R. Walton, Buckley, WA (US);
Assignee:
Theo Boeing Company, Chicago, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Apparatus and methods for inspecting a workpiece are provided. According to one embodiment, a method for inspecting a workpiece comprises illuminating at least a portion of the workpiece with at least one illumination beam and capturing at least one image including at least on line signature formed by illuminating the workpiece with the illumination beam. The method further includes performing two-dimensional and three-dimensional processes on the captured image and classifying at least one feature associated with the workpiece based at least in part on data generated by the two-dimensional and three-dimensional processes.