The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Sep. 19, 2006
Applicant:
Takafumi Nakamura, Kyoto, JP;
Inventor:
Takafumi Nakamura, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
Abstract
Adjustment of a differential refractometer includes the steps of (a) equally focusing a slit image on separate portions of a photodetector, (b) decreasing the quantity of light of measuring beam, (c) making parallel movement of the slit image on the photodetector by a predetermined displacement, and (d) increasing the quantity of light of the measuring beam.