The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7495591 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 24, 2009

Filed:

May. 31, 2007
Applicants:

Joachim Moll, Herrenberg, DE;

Heiko Schmitt, Boeblingen, DE;

Michael Fleischer-reumann, Wildberg, DE;

Inventors:

Joachim Moll, Herrenberg, DE;

Heiko Schmitt, Boeblingen, DE;

Michael Fleischer-Reumann, Wildberg, DE;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Testing a device under test—DUT—includes providing a test signal from the DUT to a test probe, taking from the test signal being present at the test probe analog samples at a first sampling rate, taking from the test signal being present at the test probe digital samples at a second sampling rate, providing a control signal indicative of sampling times of the analog samples, and performing an analysis of the digital samples in conjunction with the control signal.


Find Patent Forward Citations

Moll, Joachim. (2009). Performing a signal analysis based on digital samples in conjunction with analog samples (U.S. Patent No. 7495591). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7495591

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