The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Sep. 13, 2007
Jen-chien Hsu, Tai-Chung, TW;
Hung-wen LU, Taoyuan County, TW;
Chau-chin Su, Taipei, TW;
Yeong-jar Chang, Taichung County, TW;
Jen-Chien Hsu, Tai-Chung, TW;
Hung-Wen Lu, Taoyuan County, TW;
Chau-Chin Su, Taipei, TW;
Yeong-Jar Chang, Taichung County, TW;
Faraday Technology Corp., Hsin-Chu, TW;
Abstract
Disclosed is a sample and hold circuit for detecting a parameter of a data signal, which includes: a first switching module, wherein the sample and hold circuit samples the data signal according to the turning on or off of the first switching module; at least one capacitor, coupled to the first switching module; a second switching module, coupled to the capacitor; a controllable reference voltage source, for providing a first reference voltage to charge/discharge the capacitor via the second switching module according to a control signal; a first comparator, coupled to the capacitor, for comparing a voltage drop on the capacitor and the first reference voltage to generate a first comparing result; and a control circuit, coupled to the controllable reference voltage source and the first comparator, for generating the control signal according to the comparing results.