The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2009

Filed:

May. 18, 2005
Applicants:

Cynthia Furse, Salt Lake City, UT (US);

John Mahoney, Godfrey, IL (US);

You Chung Chung, Salt Lake City, UT (US);

Nirmal Nath Amarnath, Salt Lake City, UT (US);

Inventors:

Cynthia Furse, Salt Lake City, UT (US);

John Mahoney, Godfrey, IL (US);

You Chung Chung, Salt Lake City, UT (US);

Nirmal Nath Amarnath, Salt Lake City, UT (US);

Assignee:

University of Utah Research Foundation, Salt Lake City, UT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method provides for measuring the electrical properties of electronic signal paths, including wires and wireless channels. The device can be used for detecting open circuits, short circuits, and the lengths of wires. The device can include a sensor configured to measure a bulk electrical inductance of said wire to produce a measurement result and a processor configured to extract a length of the wire from the measurement result of the sensor.


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