The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Mar. 31, 2008
Douglas Albagli, Clifton Park, NY (US);
Aaron Judy Couture, Schenectady, NY (US);
William Andrew Hennessy, Schenectady, NY (US);
Kenneth Scott Kump, Waukesha, WI (US);
Feng Gao, Naperville, IL (US);
James Zhengshe Liu, Glenview, IL (US);
Douglas Albagli, Clifton Park, NY (US);
Aaron Judy Couture, Schenectady, NY (US);
William Andrew Hennessy, Schenectady, NY (US);
Kenneth Scott Kump, Waukesha, WI (US);
Feng Gao, Naperville, IL (US);
James Zhengshe Liu, Glenview, IL (US);
General Electric Company, Nishayuna, NY (US);
Abstract
A dual function detector device operates in either a normal operating mode or in an EMI correction mode to suppress effects of EMI within the detector. The detector device may be a flat panel x-ray detectors used in x-ray imaging systems. The device has a pixel architecture and panel read-out technique that enables real-time, high spatial frequency measurement of noise induced by electromagnetic radiation on a digital x-ray detector. The measurement can be used to calibrate the detector in real-time to attain artifact-free imaging in all environments, including those that contain temporally and spatially changing electromagnetic fields.