The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
May. 15, 2007
Applicants:
David W. Vahey, Madison, WI (US);
Jun Yong Zhu, Madison, WI (US);
Carl J. Houtman, Madison, WI (US);
Inventors:
David W. Vahey, Madison, WI (US);
Jun Yong Zhu, Madison, WI (US);
Carl J. Houtman, Madison, WI (US);
Assignee:
The United States of America as Represented by the Secretary of Agriculture, Washington, DC (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method for determining a level of effective residual ink concentration (ERIC) in a piece of recycled paper. The piece of paper is illuminated with a beam of radiation and an amount of the beam of radiation reflected and transmitted by the piece of paper is measured. The level of ERIC is determined as a function of the reflected and transmitted radiation.