The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2009

Filed:

Oct. 04, 2005
Applicants:

Jochen Franzen, Bremen, DE;

Evgenij Nikolaev, Moscow, RU;

Inventors:

Jochen Franzen, Bremen, DE;

Evgenij Nikolaev, Moscow, RU;

Assignee:

Bruker Daltonik GmbH, Bremen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to measuring methods and corresponding measuring cells for ion cyclotron resonance mass spectrometers (FTMS). The invention provides measuring methods with measuring cells, the ends of which each incorporate a large number of trapping electrodes, DC voltages of opposite polarities being applied across adjacent electrodes. For orbiting ions this builds up a repelling pseudopotential, which holds the ions in the measuring cell by reflection. This facilitates measurement of the image currents without the disturbing influence of RF voltages.


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