The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Mar. 03, 2005
Eiji Kariyada, Tokyo, JP;
Eiji Kariyada, Tokyo, JP;
NEC Corporation, , JP;
Abstract
An optical information recording medium includes an oxide/nitride dielectric film that shows a film forming rate higher than that of SiON film and hence is adapted to mass production. The recording medium shows little change in the reflectivity after a long environment test. A first dielectric layer made of ZnS—SiO, an oxide/nitride dielectric layer made of silicon-nickel oxide/nitride, a second dielectric layer made of ZnS—SiO, a first interface layer made of GeN, a recording layer made of GeSbTe, a second interface layer made of GeN, a third dielectric layer made of ZnS—SiOand a reflection layer are laid sequentially on a transparent substrate in the above mentioned order. The oxide/nitride dielectric layer is formed by reactive sputtering in a mixed gas atmosphere containing Ar gas, Ogas and Ngas. The refractive index of the oxide/nitride dielectric layer is made lower than that of the first dielectric layer and that of the second dielectric layer and the light absorption coefficient of the recording layer is made lower in an amorphous state than in a crystalline state.