The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
May. 02, 2005
Trent R. Jaeger, Croton-on-Hudson, NY (US);
Lawrence Koved, Pleasantville, NY (US);
Liangzhao Zeng, Ossining, NY (US);
Xiaolan Zhang, New Caanan, CT (US);
Trent R. Jaeger, Croton-on-Hudson, NY (US);
Lawrence Koved, Pleasantville, NY (US);
Liangzhao Zeng, Ossining, NY (US);
Xiaolan Zhang, New Caanan, CT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A unified program analysis framework that facilitates the analysis of complex multi-language software systems, analysis reuse, and analysis comparison, by employing techniques such as program translation and automatic results mapping, is presented. The feasibility and effectiveness of such a framework are demonstrated using a sample application of the framework. The comparison yields new insights into the effectiveness of the techniques employed in both analysis tools. These encouraging results yield the observation that such a unified program analysis framework will prove to be valuable both as a testbed for examining different language analysis techniques, and as a unified toolset for broad program analysis.