The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Aug. 17, 2001
Applicants:
Georg Farkas, Binz, CH;
Steffen Gappisch, Zürich, CH;
Inventors:
Georg Farkas, Binz, CH;
Steffen Gappisch, Zürich, CH;
Assignee:
NXP B.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to an arrangement for testing integrated circuits, to a test system (), to a circuit () to be tested, and to a method of testing logic circuits, where the test system () includes a programmable algorithmic test vector generator () which generates test vectors in real time so as to transfer these vectors to the circuit () to be tested.