The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
May. 23, 2006
Ralf Heilmann, Dedham, MA (US);
Mark Schattenburg, Wayland, MA (US);
Ralf Heilmann, Dedham, MA (US);
Mark Schattenburg, Wayland, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A hybrid transmission-reflection grating includes an array of essentially parallel principal interfaces, with each principal interface separating a first medium and a second medium. The first medium has a first index of refraction, and the second medium has a second index of refraction. The first medium allows for transmission of quantum-mechanical objects in excess of one percent of an incident number of quantum-mechanical objects. The array of principal interfaces has a spacing distance between adjacent principal interfaces. The first medium has a width in the direction normal to the principal interfaces, the width being less than the spacing distance. Each principal interface has a length such that either (1) the length is greater that the width divided by tan(2θ), wherein θis an critical angle of total external reflection for the quantum-mechanical objects at the principal interface, or (2) the length is greater that the width divided by tan(2θ), wherein θis a critical angle defined by 2π sin(θ)σ=λ, with λ being de Broglie wavelength of the quantum-mechanical objects and σ being a roughness of the principal interface.