The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Mar. 10, 2005
Fayin LI, Burke, VA (US);
Harry Wechsler, Fairfax, VA (US);
Fayin Li, Burke, VA (US);
Harry Wechsler, Fairfax, VA (US);
George Mason Intellectual Properties, Inc., Fairfax, VA (US);
Abstract
An open set recognition system utilizing transductive inference including capture device(s), a basis, quality checker(s), feature extractor(s), a gallery, a rejection threshold, a storage mechanism, and a recognition stage. The basis encodes sample(s) and is derived using training samples. The feature extractor(s) generates signature(s) from sample(s) using the basis. The rejection threshold is created using a rejection threshold learning mechanism that calculates the rejection threshold using sample(s) by: swapping a sample identifier with other sample identifier(s); computing a credibility value for the swapped sample identifiers; deriving a peak-to-side ratio distribution using the credibility values; and determining the rejection threshold using the peak-to-side ratio distribution. The open set recognition stage authenticates or reject as unknown the identity of unknown sample(s) using derived credibility values, derived peak-to-side ratios for the unknown sample and the rejection threshold.