The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Nov. 26, 2003
Applicants:

John M. Sabol, Sussex, WI (US);

Maggie Mei-kei Fung, Waukesha, WI (US);

Vianney Pierre Battle, Milwaukee, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Inventors:

John M. Sabol, Sussex, WI (US);

Maggie Mei-Kei Fung, Waukesha, WI (US);

Vianney Pierre Battle, Milwaukee, WI (US);

Gopal B. Avinash, New Berlin, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for analysis of image datasets acquired at different points in time. Computer aided algorithms are implemented for identification and classification of features of interest, and for comparison of such features which have evolved over time as represented by the image data. The algorithms may be specifically adapted to analyze temporal change images. Such algorithms may also be used to efficiently launch temporal change analysis only when particular features of interest are possibly present in the image data.


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