The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Jan. 31, 2007
Stefan Popescu, Erlangen, DE;
Björn Heismann, Erlangen, DE;
Eckhard Hempel, Fürth, DE;
Christian David, Lauchringen, DE;
Franz Pfeiffer, Brugg, CH;
Stefan Popescu, Erlangen, DE;
Björn Heismann, Erlangen, DE;
Eckhard Hempel, Fürth, DE;
Christian David, Lauchringen, DE;
Franz Pfeiffer, Brugg, CH;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A focus/detector system of an X-ray apparatus and a method for generating projective or tomographic phase contrast recordings, are disclosed. In an embodiment of the system, the system includes a beam source equipped with a focus and a focus-side source grating, arranged in the beam path and generates a field of ray-wise coherent X-rays, a grating/detector arrangement having a phase grating and grating lines arranged parallel to the source grating for generating an interference pattern, and a detector having a multiplicity of detector elements arranged flat for measuring the position-dependent radiation intensity behind the phase grating. Finally, the detector elements are formed by a multiplicity of elongate scintillation strips, which are aligned parallel to the grating lines of the phase grating and have a small period, whose integer multiple corresponds to the average large period of the interference pattern which is formed by the phase grating.