The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Jul. 29, 2004
Applicants:

Younglok Kim, Seoul, KR;

Jung-lin Pan, Selden, NY (US);

Ariela Zeira, Huntington, NY (US);

Inventors:

Younglok Kim, Seoul, KR;

Jung-Lin Pan, Selden, NY (US);

Ariela Zeira, Huntington, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus employed by a UE for interference signal code power noise variance estimation employing a reduced number of samples utilizing the equation where whereN=L−N·K,where and where As an alternative, a recursive technique may be employed wherein the noise variance is estimated from the ignored coefficients of the estimated channel output and upgraded recursively as per the following: where ĥare the channel estimates after the post processing and the noise variance estimates {circumflex over (σ)}, and the initial values of ĥare all zeros.


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