The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Oct. 26, 2006
Feng Zhang, Shanghai, CN;
Hongliang Chen, Shanghai, CN;
Fu Wang, Yueqing Zhejiang, CN;
Wusheng Chen, Yueqing Zhejiang, CN;
Yulin Zhang, Shanghai, CN;
Huaiyin Song, Yueqing Zhejiang, CN;
Feng Zhang, Shanghai, CN;
Hongliang Chen, Shanghai, CN;
Fu Wang, Yueqing Zhejiang, CN;
Wusheng Chen, Yueqing Zhejiang, CN;
Yulin Zhang, Shanghai, CN;
Huaiyin Song, Yueqing Zhejiang, CN;
General Protech Group, Inc., Zhejiang, CN;
Abstract
An apparatus for testing the life of a leakage current protection device having a leakage current detection circuit and a trip mechanism having a switch device. In one embodiment, the apparatus a ground fault simulation unit, a fault detector of the leakage current detection circuit and the trip mechanism, and a life testing detection control unit having an MCU for controlling operation of the fault detector. In operation, a first signal (pulse signal) is sent to the gate of the switching device to generate a first voltage at the cathode of the switching device, a second signal is sent to the ground fault simulation unit to generate a simulated ground fault for the leakage current detection circuit to generate a second voltage at the gate of the switching device, and the first and second voltages are measured to determine whether a fault exists in the leakage current detection circuit and the trip mechanism.