The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Jan. 22, 2007
Keiichiro Ishihara, Yokohama, JP;
Shigehiro Kadota, Machida, JP;
Keiichiro Ishihara, Yokohama, JP;
Shigehiro Kadota, Machida, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning apparatus in which keystone distortion non-linearity distortion in a projected image can be excellently corrected is provided. An optical scanning apparatus has light source means and deflecting means for deflecting a light beam emitted from the light source means two-dimensionally in a first direction and a second directrion, the deflection speed of the deflecting means being higher in the first direction than in the second direction. The deflecting means is driven in such a way that its angular velocity in the second direction is smaller when optically scanning a position on the surface to be scanned at which the angle of incidence of the deflected light beam in the second direction is larger than when optically scanning a position on said surface to be scanned at which the angle of incidence of the deflected light beam in said second direction is small.