The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Sep. 29, 2004
Rens Henselmans, Eindhoven, NL;
Petrus Carolus Johannes Nicolaas Rosielle, Veldhoven, NL;
Rens Henselmans, Eindhoven, NL;
Petrus Carolus Johannes Nicolaas Rosielle, Veldhoven, NL;
Abstract
A surface measuring apparatus for measuring a surface shape of an element includes a measurement frame having a mount for mounting the element to be measured, a stage including a rotatable device, the stage being movable in at least a first direction relative to the measurement frame, and a contactless distance measurement device for measuring in the first direction a distance between the measurement frame and a predetermined measurement surface provided on the rotatable device. The apparatus further comprises a second distance measurement device for measuring in a second direction a second distance between the device and a selected position on a surface of an element mounted relative to the measurement frame and a rotation measurement device for measuring an angle of rotation between the first and second direction. In this way, aspheric or free-form surfaces of optical elements can be measured easily in closed loop without introducing abbel-errors.