The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Oct. 11, 2005
Kinpui Chan, Yamagata, JP;
Masahiro Akiba, Yamagata, JP;
Yasufumi Fukuma, Tokyo, JP;
Hiroyuki Otsuka, Tokyo, JP;
Hisashi Tsukada, Tokyo, JP;
Kazuhiko Yumikake, Tokyo, JP;
Kinpui Chan, Yamagata, JP;
Masahiro Akiba, Yamagata, JP;
Yasufumi Fukuma, Tokyo, JP;
Hiroyuki Otsuka, Tokyo, JP;
Hisashi Tsukada, Tokyo, JP;
Kazuhiko Yumikake, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Provided is an optical image measuring apparatus forming a three-dimensional image based on tomographic images of an object, acquired at various depths even when the object moves during measurement. Including a half mirror () for dividing a light beam signal light (S) and reference light (R), a frequency shifter (), a reference mirror () and a piezoelectric element (9A) used to change an optical path length of the reference light (R), CCDs () for receiving interference light beams (L) resulting from interference light produced by superimposing the signal light (S) and the reference light (R) on each other by the half mirror () and outputting detection signals, an image forming portion for forming tomographic images based on the detection signals, a measurement depth calculating means (), and an image processing portion (). Forming a three-dimensional image or the like based on the arranged tomographic images.