The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7492449 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 17, 2009

Filed:

Mar. 22, 2005
Applicants:

Ifeanyi Charles Ume, Atlanta, GA (US);

Lizheng Zhang, Atlanta, GA (US);

Inventors:

Ifeanyi Charles Ume, Atlanta, GA (US);

Lizheng Zhang, Atlanta, GA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of inspection systems and methods are disclosed. One embodiment of an inspection system, among others, comprises logic configured to receive a reference signal and a target signal, the reference signal having first surface displacement information and the target signal having second surface displacement information, said logic configured to determine a correlation coefficient between the first surface displacement information and the second surface displacement information, the correlation coefficient indicating whether an inspected object exhibits a defect.


Find Patent Forward Citations

Ume, Ifeanyi. (2009). Inspection systems and methods (U.S. Patent No. 7492449). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7492449

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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