The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Jun. 19, 2006
Applicants:
Reiner Bidenbach, Vörstetten, DE;
Jens Schubert, Gundelfingen, DE;
Stefan Kredler, Heuweiler, DE;
Ralf Janke, Denzlingen, DE;
Inventors:
Reiner Bidenbach, Vörstetten, DE;
Jens Schubert, Gundelfingen, DE;
Stefan Kredler, Heuweiler, DE;
Ralf Janke, Denzlingen, DE;
Assignee:
Micronas GmbH, Freiburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing a Hall magnetic field sensor on a wafer includes generating a current flow in a Hall plate of the Hall magnetic field sensor. At least one voltage value across first and second nodes is measured and a measured voltage signal is provided indicative thereof. An electrical resistance based upon the measured voltage and the current is then determined, in the absence of an applied test magnet field.