The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Apr. 25, 2006
Christopher L. Stork, Albuquerque, NM (US);
Mark H. Van Benthem, Middletown, DE (US);
Christopher L. Stork, Albuquerque, NM (US);
Mark H. Van Benthem, Middletown, DE (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
A fast and rigorous multivariate curve resolution (MCR) algorithm is applied to remotely sensed spectral data. The algorithm is applicable in the solar-reflective spectral region, comprising the visible to the shortwave infrared (ranging from approximately 0.4 to 2.5 μm), midwave infrared, and thermal emission spectral region, comprising the thermal infrared (ranging from approximately 8 to 15 μm). For example, employing minimal a priori knowledge, notably non-negativity constraints on the extracted endmember profiles and a constant abundance constraint for the atmospheric upwelling component, MCR can be used to successfully compensate thermal infrared hyperspectral images for atmospheric upwelling and, thereby, transmittance effects. Further, MCR can accurately estimate the relative spectral absorption coefficients and thermal contrast distribution of a gas plume component near the minimum detectable quantity.