The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Jul. 23, 2007
Applicants:

Mark F. Oldham, Los Gatos, CA (US);

Howard G. King, Berkeley, CA (US);

Douwe D. Haga, Redwood City, CA (US);

Tracy L. Ferea, Mountain View, CA (US);

Inventors:

Mark F. Oldham, Los Gatos, CA (US);

Howard G. King, Berkeley, CA (US);

Douwe D. Haga, Redwood City, CA (US);

Tracy L. Ferea, Mountain View, CA (US);

Assignee:

Applera Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01T 1/20 (2006.01); G01V 8/00 (2006.01); H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for imaging an array of a plurality of features associated with a sample tile. The apparatus includes a stage that supports the sample tile in an illumination region, and an illumination source having a plurality of LEDs adapted to emit light. At least a portion of the light illuminates the illumination region. Additionally, the apparatus includes an image collecting device adapted to selectively collect images of a signal.


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