The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Nov. 13, 2006
Applicants:

John E. Campbell, Wappingers Falls, NY (US);

William T. Devine, Ulster Park, NY (US);

Kris V. Srikrishnan, Wappingers Falls, NY (US);

Inventors:

John E. Campbell, Wappingers Falls, NY (US);

William T. Devine, Ulster Park, NY (US);

Kris V. Srikrishnan, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/84 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is provided in which for fabricating a complementary metal oxide semiconductor (CMOS) circuit on a semiconductor-on-insulator (SOI) substrate. A plurality of field effect transistors (FETs) are formed, each having a channel region disposed in a common device layer within a single-crystal semiconductor layer of an SOI substrate. A gate of the first FET overlies an upper surface of the common device layer, and a gate of the second FET underlies a lower surface of the common device layer remote from the upper surface. The first and second FETs share a common diffusion region disposed in the common device layer and are conductively interconnected by the common diffusion region. The common diffusion region is operable as at least one of a source region or a drain region of the first FET and is simultaneously operable as at least one of a source region or a drain region of the second FET.


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