The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2009
Filed:
Jun. 04, 2003
Applicants:
Kai Yung, Livermore, CA (US);
Sylvia H. Fang, Fremont, CA (US);
Inventors:
Kai Yung, Livermore, CA (US);
Sylvia H. Fang, Fremont, CA (US);
Assignee:
Applera Corporation, Foster City, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F01N 3/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
An instrumentation interface that provides a standardized states of a plurality of devices to a control system. Coordinating the operation of the plurality of devices in an analytical system is simplified by allowing the control system to perform in terms of simplified standard states. Device specific states that vary for different types of devices are logically linked to the standardized states via a form of a translator. By having the control system not worry about the specifics of a device, its ability to coordinate large number of devices is improved.