The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Sep. 27, 2002
Applicants:

Tetsuya Sakata, Kyoto, JP;

Tokuo Kasai, Kyoto, JP;

Taizo Kobayashi, Kyoto, JP;

Inventors:

Tetsuya Sakata, Kyoto, JP;

Tokuo Kasai, Kyoto, JP;

Taizo Kobayashi, Kyoto, JP;

Assignee:

ARKRAY, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
Abstract

The measurement instrument includes an attribute information output section to output attribute information about the attributes of the measurement instrument as an electric physical value. The attribute information is based on at least one of the conditions including a resistance of the attribute information output section, a location of the attribute information output section, and the size of a region on which the attribute information output section is formed. The attribute information may be used to select the calibration curve suitable for the measurement instrument. The attribute information may be one that relates to a specific measurement standard applied to the measurement instrument.


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