The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2009

Filed:

Feb. 04, 2008
Applicants:

Vincent Weng, HsinChu, TW;

Jason Liao, HsinChu, TW;

James Huang, HsinChu, TW;

Inventors:

Vincent Weng, HsinChu, TW;

Jason Liao, HsinChu, TW;

James Huang, HsinChu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a method for calibrating an infrared thermometer, which can obtain a sensitivity of a radiation sensor of an infrared thermometer and a reference resistance of an ambient-temperature sensor of the infrared thermometer. The method of the present invention uses an infrared thermometer to detect two test objects respectively placed in two environments having different ambient temperatures to obtain output signals of the radiation sensor and resistances of the ambient-temperature sensor from the two test objects. Then, the method of the present invention uses the output signals of the radiation sensor and the resistances of the ambient-temperature sensor to work out the sensitivity of the radiation sensor and the reference resistance of the ambient-temperature sensor.


Find Patent Forward Citations

Loading…